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Philips PW3040 X-ray Diffractometer with X'Pert Software
Purchased with a grant from the National Science Foundation
What it does:
How it works:
During x-ray diffraction analysis, x-ray beams are reflected off the parallel
atomic layers within a mineral over a range of diffraction angles. Because the x-ray beam has a
specific wavelength, for any given 'd-spacing' (distance between adjacent atomic planes)
there are only specific angles at which the exiting rays will be 'in phase' and
therefore, will be picked up by the detector producing a peak on the 'diffractogram'.
Just like a 'fingerprint', every mineral has its own distinct set of diffraction peaks that can
be used to identify it.
Instrument Statistics:
Our system uses Cu Ka radiation that has a wavelength of
1.54Å.
Analyses are commonly run using a 40kV 45mA x-ray tube voltage, a 0.04° soller slit, 1° divergence and antiscatter slits,
and a 1/2° (for powder) or 1/4° (for clays) receiving slit.
Related Research:
This system has been used extensively to collect data for a wide variety research.
Some of the major projects include:
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Contact Information:
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