AFM Imaging and Surface Modification

Kauionalani Waller

Advisor: Dr. Joseph C. Amato, Colgate University

Abstract

The Atomic Force Microscope (AFM) is part of the family of Scanning Probe Microscopes. The AFM was developed to display topographical images of sample surfaces at nanometer scale resolution. It also has the capability to modify surfaces. A technique was developed to fabricate parallel oxidized lines through anodic oxidation with a conductive AFM tip, forming nanosize wires on the samples surface.

Kaui explaining the AFM