Anodization of Niobium Thin Film for Studies of Vortex Motion

Advisor: Dr. Joseph C. Amato

The atomic force microscope can be used to modify surfaces in addition to magnifying them. We have developed a reliable technique for creating periodic arrays of small-oxidized regions, or “dots”, on the surface of niobium thin films. The forces on the AFM tip during the oxidation process and the dynamic response of the tip were also studied in great detail. A new technique was developed which employs an oscillatory tip, similar to that used tapping mode atomic force microscopy, in order to overcome the capillary forces on the surface of the thin film and allow for reliable anodization.  Oxide dots produced with this technique have an average height of 5 nm & diameter of 120 nm.